Closing the RISC-V compliance gap: Looking from the negative testing side
Paper“Closing the RISC-V compliance gap: Looking from the negative testing side” is a DAC 2020 paper by Vladimir Herdt, Daniel Große, and Rolf Drechsler. The available evidence identifies it through the reference list of “Efficient Cross-Level Testing for Processor Verification: A RISC-V Case-Study,” where it appears as a cited work on RISC-V ISA compliance and negative testing.
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Overview
“Closing the RISC-V compliance gap: Looking from the negative testing side” is a paper listed in the references of Efficient Cross-Level Testing for Processor Verification: A RISC-V Case-Study. The reference entry identifies the authors as V. Herdt, D. Große, and R. Drechsler, and states that the paper appeared in DAC, 2020.
The title indicates that the paper addresses the RISC-V compliance gap from the perspective of negative testing. The available evidence does not include the paper’s abstract, method details, evaluation, or conclusions, so those aspects cannot be summarized here without additional sources.
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