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Bare-Metal Test Generation

Concept

Bare-metal test generation is a RISC-V verification approach centered on generating portable, software-driven tests that can stress processor and SoC behavior across simulation, emulation, FPGA prototyping, and silicon. In the provided evidence, the concept is illustrated primarily through STING, which generates constrained-random and directed bare-metal tests, and through complementary directed suites, coverage analysis, debug, and lock-step comparison flows.

First seen 5/26/2026
Last seen 5/26/2026
Evidence 2 chunks
Wiki v1

WIKI

Bare-Metal Test Generation

Overview

Bare-metal test generation is used in RISC-V processor verification to create software-driven stimulus that exercises architectural and system behavior directly on verification targets. The provided evidence describes this approach through STING, a bare-metal functional verification tool for RISC-V that generates constrained-random and directed tests. These tests are intended to be portable across simulation, emulation, FPGA prototypes, and silicon, and are self-checking to simplify debugging [STING bare-metal generator].

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RELATIONSHIPS

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STING ← implements 99% 2e
STING is explicitly described as a bare-metal functional verification tool generating bare-metal tests.

CITATIONS

20 sources
20 citations — click to expand
[1] RISC-V verification complexity source
[2] random and directed strategy source
[3] random-alone gaps source
[4] STING bare-metal generator source
[5] STING architecture source
[6] portable stimulus source
[7] shift-left verification source
[8] reported STING findings source
[9] PMP definition source
[10] Sv39 Sv48 definition source
[11] NaN definition source
[12] cache-coherence definition source
[13] coverage closure source
[14] functional stimulus coverage source
[15] ImperasTS closure source
[16] lock-step comparison source
[17] VCS role source
[18] Verdi role source
[19] ZeBu role source
[20] HAPS role source