Bare-Metal Test Generation
ConceptBare-metal test generation is a RISC-V verification approach centered on generating portable, software-driven tests that can stress processor and SoC behavior across simulation, emulation, FPGA prototyping, and silicon. In the provided evidence, the concept is illustrated primarily through STING, which generates constrained-random and directed bare-metal tests, and through complementary directed suites, coverage analysis, debug, and lock-step comparison flows.
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Bare-Metal Test Generation
Overview
Bare-metal test generation is used in RISC-V processor verification to create software-driven stimulus that exercises architectural and system behavior directly on verification targets. The provided evidence describes this approach through STING, a bare-metal functional verification tool for RISC-V that generates constrained-random and directed tests. These tests are intended to be portable across simulation, emulation, FPGA prototypes, and silicon, and are self-checking to simplify debugging [STING bare-metal generator].
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