Directed-Random Test Sequence Generation
TechniqueDirected-random test sequence generation is a model-based random testing technique used to generate instruction sequences that exercise processor implementations and compare their behavior against a model. In RISC-V verification, it is used to find counterexamples such as pipeline bugs, memory bugs, and unexpected implementation divergences, rather than to prove full equivalence.
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Overview
Directed-random test sequence generation is a model-based random testing technique used in processor verification. Instead of formally proving equivalence between a model and an implementation, the technique generates test sequences and looks for behavioral divergence; when a mismatch is found, the test provides a counterexample to equivalence.
In the RISC-V context, directed-random test-sequence generation has been used to debug pipeline and memory bugs and to uncover unexpected divergences in implementation behavior. Generated tests are commonly run on both a golden model and a processor under development so that execution traces or other observable behavior can be compared.
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