Input and Output Generation for the Verification of ALU: a Use Case
PaperFirst seen 7/28/2026
Last seen 7/28/2026
Evidence 8 chunks
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26 connectionsThe paper performs functional verification experiments on an ALU.
The paper introduces a probabilistic constrained grammar for universal stimuli generation.
The paper uses an ALU as a test case for evaluating the stimuli generation approach.
The paper evaluates USG against a built-in generator in a functional verification experiment.
The paper measures code coverage as a quality metric for the generated stimuli.
The paper uses production rules as part of the PCG definition.
The paper uses grammar constraints to control stimuli generation.
The paper demonstrates the generation mechanism using addition with carry as a main example.
The paper covers bitwise operations in the ALU grammar definition.
Carry bit propagation is modeled in the grammar to correctly generate addition results.
The paper mentions fault tolerance as the broader research goal.
RISC processors are mentioned as more complex circuits the framework was previously applied to.
ASICs are mentioned as a domain for which specific stimuli generators exist.
DSPs are mentioned as a domain for which specific stimuli generators exist.
Test vectors are mentioned as simpler stimuli that can be generated in simulation environments.
Ondrej Cekan is listed as an author of the paper.
The paper references constrained random simulation as a related concept in stimulus generation.
Richard Panek is listed as an author of the paper.
Zdenek Kotasek is listed as an author of the paper.
The paper is affiliated with Brno University of Technology.
The paper focuses on random stimuli generation for an ALU.
The paper generates expected output as part of the stimulus.
The paper uses a reference model for functional verification comparison.
ModelSim is mentioned as a simulation environment where test vectors can be generated.
MicroGP is mentioned as a related universal stimuli generator for comparison.
The paper mentions FPGA as a target for fault tolerance checking.