Directed-Random Test Sequence Generation
ConceptDirected-random test sequence generation is a processor-verification approach that combines randomized instruction sequences with directed mechanisms such as templates, constraints, assertions, and shrinking to reach architecturally interesting states and reduce failing cases.
WIKI
Overview
Directed-random test sequence generation combines random stimulus with mechanisms that steer generated instruction sequences toward useful architectural states. In the RISC-V CPU testing context described by TestRIG, generators can construct addresses within a defined memory range and emit random loads and stores; a shortened counterexample for a processor bug was reduced to three overlapping memory operations: two loads with a store between them. [Directed-random memory stimulus]
The approach can also be template- or model-directed. IBM's Genesys-Pro is described as being built on templates that intelligently solve for desired deep states. Related CHERI work generated tests from a formal CHERI-MIPS ISA model, compiled from L3 to HOL4, and used constraint solving to automatically generate instruction sequences that reach a desired state without triggering undefined behavior. The same general approach was also applied to the CHERI ARM Morello instruction set starting from a Sail model. [Template and constraint-directed generation]
NEIGHBORHOOD
No graph connections found for this entity yet. It may appear in future ingestion runs.
explore full graph →