machine learning-based test generation
TechniqueMachine learning-based test generation is referenced in the evidence as an alternative approach for instruction-stream generation in processor verification. In the cited RISC-V RTL verification context, such approaches are grouped with coverage-guided generation using Bayesian networks and fuzzing, but are described as either not designed for RTL verification, imposing restrictions on generated instruction streams, or not targeting the RISC-V ISA.
WIKI
Overview
Machine learning-based test generation refers here to a class of alternative test-generation approaches discussed in the context of instruction-stream generation for processor verification. The evidence places it alongside coverage-guided test generation based on Bayesian networks and fuzzing as one of several alternatives to model-based and constraint-solving approaches for processor test generation. [C1]
Use in processor verification context
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