Coverage directed test generation for functional verification using Bayesian networks
PaperFirst seen 7/9/2026
Last seen 7/14/2026
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8 connectionsZiv, A. is listed as a co-author of this paper.
The paper cites Fine and Ziv's Bayesian network CDG paper.
Fine, S. is listed as a co-author of this paper.
The paper introduces the Bayesian network based coverage directed test generation technique.
The paper was published at the Design Automation Conference by IEEE.
The paper uses functional coverage as a target metric for test generation.
The paper uses Bayesian networks to model CDG as a statistical inference problem.
The paper frames CDG as a statistical inference problem solved with Bayesian networks.