Overview

StressTest is a verification tool proposed for microprocessor verification. It is described as being based on feedback-adjusted Markov Models and is used to optimize stimulus generation during simulation.

Method

StressTest performs on-the-fly optimization of stimulus constraints. The workflow requires an engineer to provide a template describing points of interest inside the design under verification, also referred to as probe nodes.

During simulation, StressTest observes activity at the probe nodes. It then applies closed-loop feedback to direct the test-generator engine toward stimuli that produce higher switching activity at those probing points.

Reported effect

The cited source reports that StressTest achieved better coverage in fewer cycles than random generation techniques.

Relationship to Markov-model stimulus generation

StressTest implements a Markov-model-based approach to stimulus generation: its generation process is described as using feedback-adjusted Markov Models to steer test stimuli based on observed design activity.