HOL-TestGen — STIMSMITH

HOL-TestGen

Tool

HOL-TestGen is a model-based testing environment and extension of Isabelle/HOL. In the cited microprocessor case study, it is used to generate test sequences and synthesize test programs from an Isabelle/HOL processor model, using symbolic test-case generation, random test generation, and the integrated Z3 SMT solver.

First seen 5/25/2026

Last seen 6/8/2026

Evidence 8 chunks

Wiki v1

WIKI

Overview

HOL-TestGen is described as a model-based testing environment that extends Isabelle/HOL. In the microprocessor case study by Brucker, Feliachi, Nemouchi, and Wolff, HOL-TestGen is used with an existing Isabelle/HOL model of a processor and operating system to synthesize conformance test programs that are run against real hardware in the loop. The approach is presented as benefiting directly from existing Isabelle/HOL models and formal proofs. [HOL-TestGen as Isabelle/HOL extension; HOL-TestGen used for hardware-in-the-loop conformance testing]

Role in model-based test generation

READ FULL ARTICLE →

NEIGHBORHOOD

No graph connections found for this entity yet. It may appear in future ingestion runs.

explore full graph →

RELATIONSHIPS

10 connections

Test Program Generation for a Microprocessor: A Case-Study ← uses 100% 3e

The paper uses HOL-TestGen as its model-based testing environment.

Isabelle/HOL extends → 100% 3e

HOL-TestGen is described as an extension of Isabelle/HOL.

random test generation uses → 100% 1e

HOL-TestGen uses random test generation as part of test data selection.

higher-order logic uses → 100% 1e

HOL-TestGen expresses test specifications in higher-order logic.

gen_test_cases command ← part of 100% 1e

gen_test_cases is a command in HOL-TestGen used for test case generation.

gen_test_data command ← part of 100% 1e

gen_test_data is a command in HOL-TestGen for test data instantiation.

model-based testing implements → 100% 1e

HOL-TestGen is described as a model-based testing environment.

state-exception monad uses → 100% 1e

HOL-TestGen uses the state-exception monad for sequence test specifications.

symbolic test case generation implements → 85% 1e

HOL-TestGen supports symbolic test case generation as indicated by the paper's keywords and approach.

Z3 SMT solver uses → 100% 1e

HOL-TestGen uses Z3 as an integrated SMT solver for test data selection.

LINKED ENTITIES

8 links

Isabelle/HOL BUILT_ON Extracted graph relationship

Z3 SMT solver USES Extracted graph relationship

model-based test case generation IMPLEMENTS Extracted graph relationship

symbolic test case generation IMPLEMENTS Extracted graph relationship

state-exception monad USES Extracted graph relationship

random test generation USES Extracted graph relationship

test program generation GENERATES Extracted graph relationship

Test Program Generation for a Microprocessor: A Case-Study APPLIES Extracted graph relationship

CITATIONS

10 sources

10 citations — click to expand

[1] HOL-TestGen as Isabelle/HOL extension Test Program Generation for a Microprocessor: A Case Study

[2] HOL-TestGen used for hardware-in-the-loop conformance testing Test Program Generation for a Microprocessor: A Case Study

[3] Model-based generation from VAMP model Test Program Generation for a Microprocessor: A Case Study

[4] Verification-test integration Test Program Generation for a Microprocessor: A Case Study

[5] HOL-TestGen generation workflow Test Program Generation for a Microprocessor: A Case Study

[6] State-exception monad use Test Program Generation for a Microprocessor: A Case Study

[7] Monadic stepping functions Test Program Generation for a Microprocessor: A Case Study

[8] Sequence-test specification with mbind Test Program Generation for a Microprocessor: A Case Study

[9] HOL-TestGen used for test program generation Test Program Generation for a Microprocessor: A Case Study

[10] Certification motivation Test Program Generation for a Microprocessor: A Case Study