gen_test_data command

CodeArtifact

The gen_test_data command is a HOL-TestGen test-data instantiation command used after schematic test-case generation. In the cited microprocessor testing case study, it replaces schematic variables with concrete values for unit tests and instruction-sequence tests, including load/store, arithmetic, and branch scenarios.

First seen 5/26/2026

Last seen 5/26/2026

Evidence 3 chunks

Wiki v1

WIKI

gen_test_data command

Overview

gen_test_data is a command used in HOL-TestGen during the test-data instantiation phase. After symbolic or schematic test cases have been generated, gen_test_data instantiates schematic variables with concrete values to produce executable concrete test cases. In the VAMP microprocessor case study, this workflow is shown for load/store instructions, arithmetic instruction sequences, and branch instruction sequences.

READ FULL ARTICLE →

NEIGHBORHOOD

No graph connections found for this entity yet. It may appear in future ingestion runs.

explore full graph →

RELATIONSHIPS

1 connections

HOL-TestGen part of → 100% 1e

gen_test_data is a command in HOL-TestGen for test data instantiation.

CITATIONS

9 sources

9 citations — click to expand

[1] gen_test_data is used in HOL-TestGen for test-data instantiation by replacing schematic variables with concrete values. Test Program Generation for a Microprocessor: A Case Study

[2] gen_test_cases generates symbolic load/store test cases with uniformity hypotheses before concrete test-data instantiation. Test Program Generation for a Microprocessor: A Case Study

[3] A concrete load/store test case produced by gen_test_data is SUT σ0(Ilb 1 0 1) σ1. Test Program Generation for a Microprocessor: A Case Study

[4] A concrete load/store instruction sequence generated through test-data instantiation uses Isw 0 1 8, Ilbu 1 0 -3, and Ilbu 3 2 8. Test Program Generation for a Microprocessor: A Case Study

[5] Load/store sequence tests can reveal read/write sequencing errors, including byte-alignment errors and information loss due to pipelining. Test Program Generation for a Microprocessor: A Case Study

[6] An arithmetic sequence resulting from gen_test_data contains Isub 2 1 0 followed by two Iadd instructions. Test Program Generation for a Microprocessor: A Case Study

[7] A branch instruction sequence returned by test sequence and test data generation is [Ij 1, Ijalr 0]. Test Program Generation for a Microprocessor: A Case Study

[8] Test-data generation in the considered scenarios is performed by constraint solving and random instantiation. Test Program Generation for a Microprocessor: A Case Study

[9] The cited approach can produce coarsely grained memory access, and the authors suggest additional constraints such as bounded address ranges or load-address constraints based on prior stores. Test Program Generation for a Microprocessor: A Case Study