Coverage-Directed Test Selection
TechniqueCoverage-Directed Test Selection is a supervised-learning-based technique for simulation-based hardware verification that learns from coverage feedback to select and prioritize randomly generated tests with a high probability of increasing functional coverage, reducing wasted simulations and supporting faster coverage closure.
WIKI
Overview
Coverage-Directed Test Selection is a technique for simulation-based hardware verification. It was introduced to address a common limitation of constrained random test generation: while randomness provides diversity, tests often repeatedly exercise the same design logic, and as verification progresses many tests contribute little or nothing to functional coverage.[1][2]
Core idea
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