Automatic Test Pattern Generation
TechniqueFirst seen 7/13/2026
Last seen 7/13/2026
Evidence 5 chunks
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3 connections An Engineered Minimal-Set Stimulus for Periodic Information Leakage Fault Detection on a RISC-V Microprocessor ← uses 95% 2e
The paper uses ATPG methodology to generate binary executables for fault detection.
ATPG uses DFT scan chains for test vector delivery.
ATPG uses the PODEM algorithm to generate test patterns.