Overview
Randomised Testing of a Microprocessor Model Using SMT-Solver State Generation is a 2014 paper by B. Campbell and I. Stark. It appeared in Formal Methods for Industrial Critical Systems, edited by F. Lang and F. Flammini, on pages 185–199.
Technical focus
The paper's title identifies its focus as randomized testing of a microprocessor model using SMT-solver state generation. In later processor-verification literature, the paper is cited as reference [2] among prominent examples of approaches that use constraint-solving techniques for instruction-stream generation.
Research context
A later RISC-V processor-verification paper frames this work within the broader history of model-based instruction-stream generation for processor verification. That source describes model-based approaches as separating the test generator from the architecture description, and lists Campbell and Stark's paper among prominent constraint-solving examples in that area.
Bibliographic record
- Authors: B. Campbell and I. Stark
- Title: “Randomised Testing of a Microprocessor Model Using SMT-Solver State Generation”
- Venue: Formal Methods for Industrial Critical Systems
- Editors: F. Lang and F. Flammini
- Year: 2014
- Pages: 185–199