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Model-Based Test Generation For Processor Design Verification

Paper
First seen 7/8/2026
Last seen 8/1/2026
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Y. Lichtenstein authored by → 100% 2e
Y. Lichtenstein is listed as a co-author of this paper.
Y. Malka authored by → 100% 2e
Y. Malka is listed as a co-author of this paper.
A. Aharon authored by → 100% 2e
A. Aharon is listed as a co-author of this paper.
Model-Based Test Generation introduces → 100% 2e
The paper introduces model-based test generation for processor design verification.