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A Genetic Testing Framework for Digital Integrated Circuits

Paper
First seen 7/9/2026
Last seen 7/9/2026
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Yu, X. authored by → 100% 1e
Yu, X. is an author of A Genetic Testing Framework for Digital Integrated Circuits.
Fin, A. authored by → 100% 1e
Fin, A. is an author of A Genetic Testing Framework for Digital Integrated Circuits.
Fummi, F. authored by → 100% 1e
Fummi, F. is an author of A Genetic Testing Framework for Digital Integrated Circuits.
Rudnick, E.M. authored by → 100% 1e
Rudnick, E.M. is an author of A Genetic Testing Framework for Digital Integrated Circuits.
automatic test generation introduces → 85% 1e
The paper presents a genetic framework for automatic test generation for digital integrated circuits.