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stuck-at-fault

Concept

A stuck-at-fault is a circuit-level fault model used in implementation-based testing. In the provided microprocessor testing case study, stuck-at-fault analysis is described as modifying a circuit design with mutators that represent fabrication faults, such as broken wires between gates. The technique is effective for medium-size circuits and uses design structure to build equivalence-class tests, but it may miss higher-level design flaws such as memory write-read errors involving byte alignment.

First seen 5/26/2026
Last seen 5/26/2026
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Wiki v1

WIKI

Definition

A stuck-at-fault is a fault-analysis concept used at the circuit-design level. The provided source describes stuck-at-faults as a common analysis technique in which a given circuit design—an implementation—is modified by mutators that capture a fabrication fault model. An example fault model is that one or more wires connecting gates in the circuit are broken. [Definition and fault model]

Testing characterization

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RELATIONSHIPS

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fault model ← part of 90% 1e
Stuck-at-fault is a specific type of fault model used in testing.

CITATIONS

5 sources
5 citations — click to expand
[2] White-box and implementation-based characterization Test Program Generation for a Microprocessor: A Case Study
[3] Effectiveness for medium-size circuits Test Program Generation for a Microprocessor: A Case Study