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load and store operations

Concept

Load and store operations are treated in the provided evidence as memory-related instructions in the VAMP processor's DLX instruction set. The VAMP/DLX instruction set includes load and store operations for double words, words, half words, and bytes, and the case study tests both individual operations and sequences of such operations for conformance to an abstract assembler model.

First seen 5/26/2026
Last seen 5/26/2026
Evidence 4 chunks
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Overview

In the VAMP processor case study, load and store operations are identified as memory-related instructions within the processor's implemented DLX instruction set. The VAMP implements the full DLX instruction set, including load and store operations for double words, words, half words, and bytes, alongside shift, jump-and-link, arithmetic, and logical operations. [C1]

The processor state model used in the study includes a memory model (mm) and register files. At the ISA level, the VAMP configuration includes a 2^32-byte addressable memory model, while the assembler-level abstraction represents memory as a mapping from natural numbers to integers. [C2]

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RELATIONSHIPS

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Instruction Set Architecture part of → 100% 1e
Load and store operations are part of the DLX/VAMP instruction set.

CITATIONS

9 sources
9 citations — click to expand
[1] C1: The VAMP implements the full DLX instruction set, and that set includes load and store operations for double words, words, half words, and bytes. Test Program Generation for a Microprocessor: A Case Study
[2] C2: The VAMP state model includes memory and registers; the ISA memory model is 2^32-byte addressable, while the assembler abstraction represents memory as a mapping from naturals to integers. Test Program Generation for a Microprocessor: A Case Study
[3] C3: The study treats memory-related load and store operations as one of four instruction families examined in testing. Test Program Generation for a Microprocessor: A Case Study
[4] C4: The `is_load_store` predicate combines word, half-word, and byte load/store predicates, and the byte-level forms shown include `Ilb`, `Ilbu`, and `Isb`. Test Program Generation for a Microprocessor: A Case Study
[5] C5: For load/store unit testing, HOL-TestGen generated 8 symbolic test cases corresponding to the different load and store operations, each with a uniformity hypothesis. Test Program Generation for a Microprocessor: A Case Study
[6] C6: A concrete `Ilb 1 0 1` unit test has an expected final state, and such tests can reveal incorrect operation results and undesired state modifications. Test Program Generation for a Microprocessor: A Case Study
[7] C7: Load/store instruction sequences are characterized by generalizing `is_load_store` to instruction lists using `list_all`, with monadic combinators used to define valid test sequences. Test Program Generation for a Microprocessor: A Case Study
[8] C8: A generated load/store sequence can include `Isw` followed by two `Ilbu` operations, and instantiated sequences may reveal read/write sequencing errors, byte-alignment errors, or information loss due to pipelining. Test Program Generation for a Microprocessor: A Case Study
[9] C9: Final-state postconditions may be unrealistic for hardware processors because internal registers may not be directly observable; step-by-step checking via `return` is described as an alternative. Test Program Generation for a Microprocessor: A Case Study