Coverage-guided test generation
ConceptCoverage-guided test generation is a family of testing techniques that steer the production of tests or instruction streams using coverage-related feedback. The provided evidence documents its application in three domains: (1) RISC-V processor verification, where a randomized instruction-stream generator evolves at runtime based on observed coverage in tight co-simulation with an ISS, combined with Coverage-guided Aging to regularize the coverage distribution; (2) LLM-driven software testing, where a code-aware prompting strategy (SymPrompt) decomposes test generation into execution-path-aligned stages; and (3) deep learning system testing, where combinatorial-coverage criteria are adapted into a CT coverage-guided test generation technique.
WIKI
Overview
Coverage-guided test generation is a class of testing techniques that use coverage-related feedback to steer the production of tests or instruction streams. The evidence covers three distinct application domains: RISC-V processor verification, LLM-driven software test generation, and deep learning system testing.
RISC-V processor verification
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