Assembly Test Generation
ConceptAssembly test generation, in the context of LLM-assisted processor verification, refers to the production of test programs written directly in assembly language targeting a processor's instruction set architecture (ISA), used as stimuli during simulation-based functional verification. In the cited neuromorphic processor verification work, assembly tests are generated for a custom neuromorphic ISA, while C programs are generated for the RISC-V (RV64I) ISA. The approach leverages a large language model (GPT-3.5) prompted with instruction-level descriptions to produce loop-based assembly test programs that exercise neuromorphic instructions such as weight and spike loading.
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Assembly Test Generation
Definition
Assembly test generation is the production of test programs written in a target processor's assembly language, where each test is a sequence of instructions at the ISA level intended to exercise specific architectural features. In simulation-based functional verification, these assembly programs are assembled into executable binary files that serve as stimuli for the design under test (DUT).
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