Constraint satisfaction for random test program generation

Constraint Satisfaction for Random Test Program Generation

Technique

A technique that models the generation of random test programs as a constraint satisfaction problem, enabling systematic exploration of instruction sequences while satisfying architectural and semantic constraints. It was introduced by Bin, Emek, Shurek, and colleagues for processor verification and is cited as a foundational reference in subsequent test-sequence generation methods.

First seen 6/25/2026

Last seen 7/16/2026

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Overview

Constraint satisfaction for random test program generation is a verification-oriented technique in which the construction of random test programs is formulated and solved as a constraint satisfaction problem. Rather than producing test programs by unrestricted randomness, the approach imposes formal constraints that capture architectural and semantic requirements of the design under test, and then uses constraint solvers to produce programs that satisfy those constraints while still exhibiting randomized characteristics.

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Using a constraint satisfaction formulation and solution techniques for random test program generation ← introduces 95% 2e

The paper introduces the use of constraint satisfaction formulation for random test program generation.

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CITATIONS

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[1] The technique is introduced by Bin, Emek, Shurek et al. in IBM Systems Journal, 2002, 41(3): 386–402, DOI 10.1147/sj.413.0386. A RISC-V Test Sequences Generation Method Based on Instruction ...

[2] The paper is cited as reference [17] in subsequent RISC-V test sequence generation literature. A RISC-V Test Sequences Generation Method Based on Instruction ...