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Constraint-Based Automatic Test Data Generation

Technique

A test data generation technique that solves constraints to produce valid memory accesses for automatic test generation, originally formulated by DeMilli and Offutt (1991) and extended to handle complex addressing modes in architectures such as PowerPC and x86.

First seen 7/8/2026
Last seen 7/8/2026
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Constraint-Based Automatic Test Data Generation

Definition

Constraint-based automatic test data generation is a technique in software testing that formulates test inputs as solutions to a system of constraints derived from the program or model under test. A central application is solving constraints for memory access generation: producing operand addresses that satisfy the addressing-mode requirements of the target instruction set, so that generated tests can exercise code without triggering spurious memory faults.

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The paper references constraint-based automatic test data generation as prior work.

CITATIONS

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[1] Constraint-based automatic test data generation was introduced by DeMilli and Offutt in IEEE TSE 1991 (17(9):900-910). Constraint-based automatic test data generation
[2] A framework and algorithm for address constraint satisfaction was implemented in the Model-Based Test-Generator at IBM Research - Haifa. Constraint satisfaction for test program generation
[3] The algorithm handles complex addressing modes in PowerPC, x86, and other architectures. Constraint satisfaction for test program generation
[4] The framework is generic and allows flexibility in modeling new addressing modes for memory access generation. Constraint satisfaction for test program generation
[5] Constraint satisfaction is an NP-complete problem in the general case (Garey and Johnson, 1979). Constraint satisfaction for test program generation