Constraint-Based Automatic Test Data Generation
TechniqueA test data generation technique that solves constraints to produce valid memory accesses for automatic test generation, originally formulated by DeMilli and Offutt (1991) and extended to handle complex addressing modes in architectures such as PowerPC and x86.
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Constraint-Based Automatic Test Data Generation
Definition
Constraint-based automatic test data generation is a technique in software testing that formulates test inputs as solutions to a system of constraints derived from the program or model under test. A central application is solving constraints for memory access generation: producing operand addresses that satisfy the addressing-mode requirements of the target instruction set, so that generated tests can exercise code without triggering spurious memory faults.
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