Overview
Peter G. Neumann is identified in the available evidence as one of the authors of the paper "Randomized Testing of RISC-V CPUs using Direct Instruction Injection". The paper appears in IEEE Design & Test, 2023 and presents TestRIG, a testing framework for RISC-V implementations based on randomized instruction generation and Direct Instruction Injection (DII). [Author listing; TestRIG paper context]
Associated work
Randomized Testing of RISC-V CPUs using Direct Instruction Injection
The paper lists the following authors: Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno van der Maas, Matthew Naylor, Michael Roe, Robert N. M. Watson, Peter G. Neumann, and Simon W. Moore. [Author listing]
The work describes TestRIG, short for Testing with Random Instruction Generation, as a framework for testing RISC-V implementations. It compares executable formal models, software ISA simulators, and simulated execution of hardware designs by generating random instruction sequences, executing them on both a model and an implementation under test, and comparing execution traces. [TestRIG framework]
The paper also describes Direct Instruction Injection (DII), a technique in which the next instruction to be executed is supplied by the test harness regardless of the CPU program counter, rather than being fetched normally from program memory. [Direct Instruction Injection]
Research context in the cited paper
The cited paper situates TestRIG in the context of RISC-V formal modeling using the Sail language. It notes that while full-processor formal equivalence proof remains difficult, randomized tandem execution can reveal divergences between a formal model and an implementation during development. [RISC-V and Sail context]
The authors report using TestRIG to test many standard RISC-V extensions and the experimental CHERI security extension. They also state that TestRIG became easier to use than instruction-set-level unit tests in their development workflow and provided more thorough coverage through randomized generation. [TestRIG evaluation]