Peter G. Neumann
PersonPeter G. Neumann is listed as a co-author of the paper "Randomized Testing of RISC-V CPUs using Direct Instruction Injection," an IEEE Design & Test 2023 article about TestRIG, a randomized testing framework for RISC-V implementations.
First seen 5/27/2026
Last seen 6/9/2026
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Overview
Peter G. Neumann is identified in the available evidence as one of the authors of the paper "Randomized Testing of RISC-V CPUs using Direct Instruction Injection". The paper appears in IEEE Design & Test, 2023 and presents TestRIG, a testing framework for RISC-V implementations based on randomized instruction generation and Direct Instruction Injection (DII). [Author listing; TestRIG paper context]
Associated work
NEIGHBORHOOD
2 nodes · 1 edgesgraph · Peter G. Neumann · depth=1
RELATIONSHIPS
1 connectionsPeter G. Neumann is listed as an author of the paper.
CITATIONS
6 sources6 citations — click to expand
[1] Peter G. Neumann is listed as a co-author of "Randomized Testing of RISC-V CPUs using Direct Instruction Injection." Randomized Testing of RISC-V CPUs using Direct
[2] The paper appears as an IEEE Design & Test 2023 article and describes TestRIG as a testing framework for RISC-V implementations. Randomized Testing of RISC-V CPUs using Direct
[3] TestRIG generates random instruction sequences, runs them on both a model and an implementation under test, and compares execution traces in tandem execution. Randomized Testing of RISC-V CPUs using Direct
[4] Direct Instruction Injection supplies the next instruction from the test harness regardless of the CPU program counter. Randomized Testing of RISC-V CPUs using Direct
[5] The paper discusses RISC-V formal modeling in Sail and frames TestRIG as a pragmatic compromise because full-processor formal equivalence proof is not yet routinely automated. Randomized Testing of RISC-V CPUs using Direct
[6] The authors report using TestRIG to test standard RISC-V extensions and the experimental CHERI security extension, and state that it replaced their instruction-set-level unit testing for development. Randomized Testing of RISC-V CPUs using Direct