Overview
X-Gen: A Random Test-Case Generator for Systems and SoCs is a 2002 paper by R. Emek, I. Jaeger, Y. Naveh, G. Bergman, G. Aloni, Y. Katz, M. Farkash, I. Dozoretz, and A. Goldin. It appeared in the Seventh IEEE International High-Level Design Validation and Test Workshop (HLDVT-02), on pages 145–150.
The paper is cited as the publication associated with X-Gen, a project initiated in 2000 to apply random stimuli generation technology to system-level stimuli generation for hardware verification.
Technical context
The available evidence places X-Gen in IBM's constraint-based random stimuli generation work. X-Gen followed the successful use of similar technology for processor verification and was designed with a knowledge-based architecture similar to Genesys PE. It also used the same CSP solver.
The main architectural distinction described for X-Gen was its modeling language: because X-Gen targeted system-level verification, the language made components, system transactions, and configurations first-class elements.
Reported evaluation and deployment
In 2002, X-Gen was tested in parallel with a legacy, non-knowledge-based system stimuli generator. The reported result was that X-Gen achieved higher coverage metrics while using one-fifth of the simulation time and one-tenth of the test templates.
This result positioned X-Gen as the primary stimuli generator for IBM high-end systems. The evidence states that, since 2002, X-Gen was used in verification of most IBM high-end system designs, including p-Series servers and Cell-processor-based systems.
Significance
Based on the cited evidence, X-Gen represents an application of knowledge-based, CSP-supported random test generation beyond processor-level verification and into system-level hardware verification. Its modeling language adapted the generation framework to system-level concepts such as configurations and transactions.