Overview

Model Based Test Generation for Processor Verification is a paper referenced in the AAAI 2006 paper Constraint-Based Random Stimuli Generation for Hardware .... The cited bibliographic entry lists the work as authored by Y. Lichtenstein, Y. Malka, and A. Aharon, published in 1994.

Bibliographic record

The available evidence gives the following citation:

Lichtenstein, Y.; Malka, Y.; and Aharon, A. 1994. Model based test generation for processor verification. In Sixth Annual Conference on Innovative Applications of Artificial Intelligence, 83–94.

This identifies the publication venue as the Sixth Annual Conference on Innovative Applications of Artificial Intelligence and the page range as 83–94.

Evidence context

The paper appears in the references of a later AAAI paper whose summary states that IBM presented random stimuli generation for hardware verification as a complex application relying on various AI techniques, and that ongoing work explored more sophisticated constraint satisfaction problem (CSP) and knowledge representation techniques for increasing hardware-system and business complexity. Within that references section, Model Based Test Generation for Processor Verification is listed alongside other works on hardware verification, random test generation, and constraint satisfaction.

Scope of available information

The provided evidence supports bibliographic facts about the paper—title, authors, year, venue, and pages—and establishes that it was cited in a 2006 AAAI hardware-verification paper. The provided evidence does not include the paper’s abstract, internal methodology, experimental results, processor target, or detailed technical contribution.