Overview
A Test Generation Framework for Datapath Floating-Point Verification is a paper listed as a 2003 publication by M. Aharoni, S. Asaf, L. Fournier, A. Koyfman, and R. Nagel. The available bibliographic entry gives its venue as the Eighth IEEE International High-Level Design Validation and Test Workshop (HLDVT-03) and its page range as 17–22.
Bibliographic details
| Field | Value |
|---|---|
| Title | A Test Generation Framework for Datapath Floating-Point Verification |
| Authors | M. Aharoni; S. Asaf; L. Fournier; A. Koyfman; R. Nagel |
| Year | 2003 |
| Venue | Eighth IEEE International High-Level Design Validation and Test Workshop (HLDVT-03) |
| Pages | 17–22 |
Evidence context
The available source is a 2006 AAAI paper on constraint-based random stimuli generation for hardware verification. In its summary, that source characterizes IBM random stimuli generation for hardware verification as a complex application relying on AI techniques, including constraint-satisfaction and knowledge-representation approaches. The 2003 Aharoni et al. paper appears in that source's references.
Limitations of the available record
The supplied evidence provides a bibliographic reference but does not include the paper's abstract, technical method, experimental results, DOI, publisher page, or full text. Therefore, no specific claims about the framework's internal architecture or verification results are made here.