uniformity hypothesis

Concept

A uniformity hypothesis is a proof obligation generated alongside a symbolic test case in HOL-TestGen. In the cited microprocessor test-generation case study, it permits selecting one concrete witness for each symbolic test case during test data instantiation.

First seen 5/26/2026

Last seen 5/26/2026

Evidence 2 chunks

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WIKI

Definition

In the HOL-TestGen microprocessor case study, a uniformity hypothesis is generated for each symbolic test case. Its role is to justify selecting one concrete witness value for the schematic variables of that symbolic test case during test data instantiation. [C1]

Form in generated tests

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symbolic test case generation part of → 90% 1e

The uniformity hypothesis is a key component of the symbolic test case generation process in HOL-TestGen.

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HOL-TestGen generated_by The evidence states that the HOL-TestGen test case generation procedure produces symbolic test cases and associated uniformity hypotheses.

CITATIONS

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5 citations — click to expand

[1] C1: A uniformity hypothesis is stated on each symbolic test case and allows selecting one concrete witness for that symbolic test case. Test Program Generation for a Microprocessor: A Case Study

[2] C2: The evidence gives a load-byte symbolic test case with schematic variables and an associated THYP formula of existential-to-universal form. Test Program Generation for a Microprocessor: A Case Study

[3] C3: For a generated instruction-sequence test, the first subgoal is the schematic test case and the second subgoal states the uniformity hypothesis. Test Program Generation for a Microprocessor: A Case Study

[4] C4: In the load/store scenario, HOL-TestGen generated eight symbolic test cases with eight associated uniformity hypotheses, and their conjunction is called a test theorem. Test Program Generation for a Microprocessor: A Case Study

[5] C5: The gen_test_data command instantiates schematic variables with concrete values, producing a concrete instruction sequence such as Isw 0 1 8, Ilbu 1 0 -3, Ilbu 3 2 8. Test Program Generation for a Microprocessor: A Case Study