Overview

The reconfigurable model-based test program generator is represented in the evidence by the publication titled “Reconfigurable model-based test program generator for microprocessors.” The title indicates a test-program generation approach that is both model-based and reconfigurable, with microprocessors as its target domain.

Bibliographic record

• Authors: Alexander Kamkin, Eugene Kornykhin, and Dmitry Vorobyev
• Title: “Reconfigurable model-based test program generator for microprocessors”
• Venue: Software Testing Verification and Validation Workshop, IEEE International Conference
• Year: 2011
• Pages: 47–54
• DOI: 10.1109/ICSTW.2011.35

Technical context from the evidence

The work appears in the reference list of “Test Program Generation for a Microprocessor: A Case Study.” In that bibliography, it is listed near other microprocessor validation and test-generation works, including entries on functional test-program generation, configurable random test-program generation, and specification-driven directed test generation for pipelined processors. The evidence therefore situates the work within the broader technical area of microprocessor test-program generation and validation literature.