Reconfigurable model-based test program generator
ConceptA reconfigurable model-based test program generator is identified in the available evidence as a microprocessor test-program generation work by Alexander Kamkin, Eugene Kornykhin, and Dmitry Vorobyev, published in 2011 in the IEEE International Conference on Software Testing, Verification and Validation Workshop proceedings.
First seen 5/26/2026
Last seen 5/26/2026
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WIKI
Overview
The reconfigurable model-based test program generator is represented in the evidence by the publication titled “Reconfigurable model-based test program generator for microprocessors.” The title indicates a test-program generation approach that is both model-based and reconfigurable, with microprocessors as its target domain.
Bibliographic record
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1 connectionsThe paper cites reconfigurable model-based test program generation as related work.
CITATIONS
5 sources5 citations — click to expand
[1] The entity is represented by the publication titled “Reconfigurable model-based test program generator for microprocessors.” Test Program Generation for a Microprocessor: A Case Study
[2] The publication was authored by Alexander Kamkin, Eugene Kornykhin, and Dmitry Vorobyev. Test Program Generation for a Microprocessor: A Case Study
[3] The publication appeared in the Software Testing Verification and Validation Workshop, IEEE International Conference, in 2011, on pages 47–54. Test Program Generation for a Microprocessor: A Case Study
[4] The DOI for the publication is 10.1109/ICSTW.2011.35. Test Program Generation for a Microprocessor: A Case Study
[5] The work is cited in the reference list of “Test Program Generation for a Microprocessor: A Case Study” alongside other microprocessor test-generation and validation literature. Test Program Generation for a Microprocessor: A Case Study