functional test program generation

Concept

Functional test program generation is a processor-validation topic evidenced in the microprocessor testing literature, including a cited methodology by Fallah and Takayama and related work on model-based, random, and specification-driven directed test generation for microprocessors and pipelined processors.

First seen 5/26/2026

Last seen 5/26/2026

Evidence 1 chunks

Wiki v1

WIKI

Overview

Functional test program generation is evidenced as a named methodology in processor testing literature: Fallah and Takayama published “A new functional test program generation methodology” in the 2001 International Conference on Computer Design proceedings. The same bibliography appears in a paper titled “Test Program Generation for a Microprocessor: A Case Study,” placing the topic in the context of microprocessor test-program generation.

Technical context

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NEIGHBORHOOD

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RELATIONSHIPS

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test program generation part of → 85% 1e

Functional test program generation is a type of test program generation.

CITATIONS

6 sources

6 citations — click to expand

[1] A paper titled “Test Program Generation for a Microprocessor: A Case Study” is the source containing the bibliography excerpt. Test Program Generation for a Microprocessor: A Case Study

[2] Fallah and Takayama published “A new functional test program generation methodology” in the 2001 International Conference on Computer Design proceedings. Test Program Generation for a Microprocessor: A Case Study

[3] The evidence cites a reconfigurable model-based test program generator for microprocessors by Kamkin, Kornykhin, and Vorobyev. Test Program Generation for a Microprocessor: A Case Study

[4] The evidence cites CRPG as a configurable random test-program generator for microprocessors by Shen, Ma, and Zhang. Test Program Generation for a Microprocessor: A Case Study

[5] The evidence cites specification-driven directed test generation for validation of pipelined processors by Mishra and Dutt. Test Program Generation for a Microprocessor: A Case Study

[6] The bibliography excerpt includes formal-methods and tooling references such as HOL-TestGen, Z3, Isabelle/HOL, and formal verification work. Test Program Generation for a Microprocessor: A Case Study