Constructive Test Generation
ConceptConstructive test generation is a hardware-fuzzing paradigm in which test programs are assembled instruction by instruction from scratch, rather than produced by mutating an existing seed. It trades the structural fragility of mutation-based fuzzers for a combinatorial search space that must respect syntactic and semantic validity, and is the foundation of generation-based CPU fuzzers such as Cascade and HiFuzz.
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Definition
Constructive test generation is a program-synthesis approach to hardware (CPU) fuzzing in which each test program is assembled from scratch at the granularity of basic blocks and individual instructions, in contrast to coverage-guided mutation, which produces a new test by applying a discrete operator to a seed program [1]. Because the generator must decide every control-flow and data-flow decision itself, the search space is combinatorial and every emitted instruction has to respect both ISA-level legality and intra-program dependencies.
Control-Validity Dilemma
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