Bayesian Network Coverage-directed Test Generation

Concept

Bayesian Network Coverage-directed Test Generation is a coverage-guided test generation approach for functional verification that uses Bayesian networks. In the DATE 2022 related-work survey on processor verification, it is cited as an alternative to model-based, constraint-based test generation, and grouped with other non-model-based guidance techniques whose broader class is described as not targeting RTL verification well, restricting generated instruction streams, and not addressing modern RISC-V ISA verification.

First seen 5/29/2026

Last seen 5/30/2026

Evidence 2 chunks

Wiki v1

WIKI

Overview

Bayesian Network Coverage-directed Test Generation is identified in the literature as a coverage-guided test generation approach for functional verification that uses Bayesian networks. The DATE 2022 paper Cross-Level Processor Verification via Coverage-guided Aging cites the original reference as S. Fine and A. Ziv, "Coverage directed test generation for functional verification using bayesian networks", published at DAC 2003.

Position in test-generation literature

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RELATIONSHIPS

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Model-based Test Generation part of → 80% 1e

Bayesian network coverage-directed test generation is an alternative approach to model-based test generation.

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Model-based Test Generation PART_OF Extracted graph relationship

CITATIONS

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[1] Bayesian Network Coverage-directed Test Generation is a coverage-guided test generation approach for functional verification using Bayesian networks. Cross-Level Processor Verification via Coverage-guided Aging

[2] The DATE 2022 paper cites the original work as S. Fine and A. Ziv, "Coverage directed test generation for functional verification using bayesian networks," DAC 2003, pp. 286–291. Cross-Level Processor Verification via Coverage-guided Aging

[3] In DATE 2022 related work, coverage-guided test generation based on Bayesian networks is presented as an alternative to model-based test generators that use constraint-based specification formats. Cross-Level Processor Verification via Coverage-guided Aging

[4] The DATE 2022 survey states that the broader class of alternative approaches including Bayesian-network-based coverage guidance is either not designed for RTL verification or imposes restrictions on generated instruction streams, and does not target the modern RISC-V ISA. Cross-Level Processor Verification via Coverage-guided Aging