Bayesian Network-based Coverage-directed Test Generation
ConceptBayesian Network-based Coverage-directed Test Generation (CDG) is a functional hardware verification technique introduced by Fine and Ziv at DAC 2003, which uses Bayesian networks to guide test generation toward coverage goals. It belongs to the broader family of coverage-directed test generation methods and is cited as foundational work by subsequent randomized and coverage-guided verification approaches.
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Bayesian Network-based Coverage-directed Test Generation
Overview
Bayesian Network-based Coverage-directed Test Generation (CDG) is a functional verification technique that uses Bayesian networks to model the relationship between test program parameters and the resulting functional coverage, in order to steer test generation toward under-covered parts of a design's state space. The approach was introduced by S. Fine and A. Ziv in the paper "Coverage directed test generation for functional verification using bayesian networks," presented at the Design Automation Conference (DAC) in 2003, pages 286–291 [9].
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