Constraint satisfaction for test program generation

2002. 25 citations.

Abstract

A central problem in automatic test generation is solving constraints for memory access generation. A framework, and an algorithm that has been implemented in the Model-Based Test-Generator are described. This generic algorithm allows flexibility in modeling new addressing modes with which memory accesses are generated. The algorithm currently handles address constraint satisfaction for complex addressing modes in the PowerPC, x86, and other architectures.< >

Authors

• Daniel R. Lewin (IBM Research - Haifa): h-index 26; 3,897 citations; corresponding author
• Laurent Sébastien Fournier (IBM Research - Haifa): h-index 12; 664 citations
• Moshe Levinger (IBM Research - Haifa): h-index 7; 328 citations
• E. Roytman (IBM Research - Haifa): h-index 2; 46 citations
• Gil Shurek (IBM Research - Haifa): h-index 11; 641 citations

Topics

Software Testing and Debugging Techniques, Real-time simulation and control systems, Software System Performance and Reliability, PowerPC, Computer science

References

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• R.A. DeMilli, A. Jefferson Offutt. Constraint-based automatic test data generation. IEEE Transactions on Software Engineering. 1991;17(9):900-910. doi:10.1109/32.92910.