Skip to content
STIMSMITH

IEEE Design & Test of Computers

Organization WIKI v1 · 6/9/2026

IEEE Design & Test of Computers is an IEEE-affiliated scholarly journal that publishes peer-reviewed articles on the design, test, and verification of computing systems. It is referenced on researchr.org under the short handle 'dt' and assigns DOIs through the IEEE/MDAT identifier scheme.

Overview

IEEE Design & Test of Computers is a scholarly journal associated with the IEEE (Institute of Electrical and Electronics Engineers). It is catalogued on researchr.org under the journal handle dt, indicating an internal short identifier used to disambiguate it from other IEEE periodicals.

Publishing profile

The journal publishes technical articles related to the design, test, and verification of computer hardware and systems. Papers are assigned DOIs using the MDAT prefix, which is associated with IEEE's periodical numbering for the magazine/journal in the design and test area.

Articles in IEEE Design & Test of Computers are organized into volumes, issues, and page ranges, following the standard IEEE periodical metadata format (e.g., volume(issue):pages, month year).

Example publication

Evidence indicates the journal has published, among other works, the following article:

  • Randomized Testing of RISC-V CPUs Using Direct Instruction Injection, by Alexandre Joannou, Peter Rugg, Jonathan Woodruff, Franz A. Fuchs, Marno van der Maas, Matthew Naylor, Michael Roe, Robert N. M. Watson, Peter G. Neumann, and Simon W. Moore. Published in IEEE Design & Test of Computers, volume 41, issue 1, pages 40–49, February 2024. DOI: 10.1109/MDAT.2023.3262741.

Identifiers and metadata

  • Journal URL on researchr.org: https://researchr.org/journal/dt/home
  • DOI prefix family: MDAT (IEEE)
  • Issue/volume example: Vol. 41, No. 1 (Feb 2024)

Note: The scope of this article is limited to information present in the provided evidence. Independent verification from IEEE's official sources is recommended for editorial board, impact factor, indexing, and full publication history.

LINKED ENTITIES

1 links
Randomized Testing of RISC-V CPUs using Direct Instruction Injection PUBLISHED_BY

CITATIONS

4 sources
4 citations
[1] IEEE Design & Test of Computers is a journal listed on researchr.org under the handle 'dt'. researchr.org journal page (referenced via publication metadata)
[2] The journal uses the IEEE 'MDAT' DOI prefix for its articles. DOI 10.1109/MDAT.2023.3262741 (IEEE)
[3] The journal published 'Randomized Testing of RISC-V CPUs Using Direct Instruction Injection' by Joannou et al. in Vol. 41, No. 1, pp. 40-49, February 2024. Randomized Testing of RISC-V CPUs Using Direct Instruction Injection - researchr publication
[4] Articles in IEEE Design & Test of Computers are organized into volumes, issues, and page numbers following standard IEEE periodical metadata conventions. Randomized Testing of RISC-V CPUs Using Direct Instruction Injection - researchr publication