Specification-driven Test Generation
ConceptSpecification-driven test generation is a test-program generation approach in which test programs for microprocessor verification are produced from an architectural specification, combined with user-supplied constraints and constraint-solving techniques. The provided evidence connects this concept to two specific works: the MA2TG tool (Li et al., 2005), which implements specification-driven, constraint-solving-based generation of test programs from simple to complex ones, and Mishra and Dutt's 2008 article on specification-driven directed test generation for validation of pipelined processors, which is cited in a microprocessor test-program-generation case study (Brucker et al., 2013).
WIKI
Overview
Specification-driven test generation is a test-generation approach in which test programs for microprocessor verification are produced from an architectural specification rather than hand-written or purely randomized. In the provided evidence, the term is associated with two distinct works:
- The MA2TG paper (Li, Zhu, Guo, Liu, and Li, 2005), which presents a "novel specification driven and constraints solving based method to automatically generate test programs from simple to complex ones for advanced microprocessors." [MA2TG characterization]
- The Mishra and Dutt 2008 article, Specification-driven directed test generation for validation of pipelined processors, published in ACM Transactions on Design Automation of Electronic Systems 13(3), cited as reference [19] in Brucker et al.'s Test Program Generation for a Microprocessor: A Case Study. [Mishra and Dutt citation]
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