specification-driven test generation
ConceptSpecification-driven test generation is documented in processor-validation literature through work on specification-driven directed test generation for validating pipelined processors. In the provided evidence, it appears as a referenced research topic within a microprocessor test-program-generation case study, alongside functional, model-based, and random test-program generation approaches.
WIKI
Overview
Specification-driven test generation is a test-generation approach identified in the processor-validation literature. The provided evidence specifically cites Prabhat Mishra and Nikil Dutt's 2008 article, Specification-driven directed test generation for validation of pipelined processors, published in ACM Transactions on Design Automation of Electronic Systems 13(3). This establishes the concept in the context of directed test generation and pipelined-processor validation. [Term and canonical cited work]
Context in microprocessor test generation
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