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sequence testing

Concept

Sequence testing is a testing approach in which system behavior is specified and checked over sequences of inputs, outputs, and state transitions rather than only a single operation. In the provided evidence, sequence-test-oriented generation is contrasted with unit-test-oriented generation, modeled using state-exception monads in HOL-TestGen, and applied to processor conformance testing over instruction sequences.

First seen 5/25/2026
Last seen 5/26/2026
Evidence 5 chunks
Wiki v1

WIKI

Definition

Sequence testing is a testing approach in which tests describe sequences of state transitions that a system may perform. In contrast to unit-test-oriented generation, which uses preconditions and postconditions of individual system operations, sequence-test-oriented approaches use temporal specifications or automata-based specifications of system behavior. In processor test-program generation, the processor state is an important part of the test description, and tests describe sequences of state transitions caused by executing program instructions.

Relation to unit testing

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RELATIONSHIPS

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The paper applies sequence testing to test sequences of instructions.
state-space explosion ← part of 90% 1e
Sequence testing is susceptible to state-space explosion.

CITATIONS

11 sources
11 citations — click to expand
[1] Sequence-test-oriented approaches use temporal specifications or automata-based specifications of system behavior, whereas unit-test-oriented methods use preconditions and postconditions of operation specifications. Test Program Generation for a Microprocessor: A Case Study
[2] In processor test-program generation, sequence tests describe sequences of state transitions that the processor may perform while executing program instructions. Test Program Generation for a Microprocessor: A Case Study
[3] A sequence testing scenario requires control of internal-state initialization and sometimes reference to the final state; the test result is inferred from a sequence of system inputs and observed outputs. Test Program Generation for a Microprocessor: A Case Study
[4] Unit testing is described as a special one-step form of sequence testing where the output state is more or less completely accessible for the test. Test Program Generation for a Microprocessor: A Case Study
[5] HOL-TestGen supports sequence test specifications using the state-exception monad, modeling partial state-transition functions of type σ ⇀ (o × σ). Test Program Generation for a Microprocessor: A Case Study
[6] Programs under test can be modeled as input/output stepping functions that may fail for a given state and input or produce an output and successor state. Test Program Generation for a Microprocessor: A Case Study
[7] HOL-TestGen uses mbind to feed a list of inputs successively into the system under test and stop when an error occurs; this is its standard way to represent sequence test specifications. Test Program Generation for a Microprocessor: A Case Study
[8] When a postcondition depends explicitly on the state, the evidence uses assertSE rather than return(P). Test Program Generation for a Microprocessor: A Case Study
[9] The evidence distinguishes sequence-test scenarios based on local-step observations from scenarios based on testing the final state; in the VAMP application, final-state checks were the relevant class. Test Program Generation for a Microprocessor: A Case Study
[10] In the VAMP case study, sequence testing was used to test instruction sequences up to a given length, with instruction subsets including load/store, arithmetic, logic, and control-flow operations. Test Program Generation for a Microprocessor: A Case Study
[11] Preconditions, also called test purposes, are added to test specifications to restrict generated instruction sequences to a selected subset. Test Program Generation for a Microprocessor: A Case Study