Automatic Test Program Generation
ConceptAutomatic test program generation is the process of producing executable test cases for a design under test (DUT), typically a microprocessor, by formulating the generation task as a constraint satisfaction problem (CSP) and solving it automatically. The most general formulation uses an Extended Conditional Constraint Satisfaction Problem (ECondCSP), an extension of Conditional CSP (CondCSP) that preserves constraint semantics even when referenced variables are inactive, enabling compact modeling of complex verification scenarios driven by user-defined micro-architectural events.
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Automatic Test Program Generation
Overview
Automatic test program generation is the automated construction of test programs (and their expected behaviors) for a design under test (DUT), commonly a microprocessor or other computing device. It is typically cast as a constraint satisfaction problem (CSP) so that the generator can systematically produce test cases that satisfy user-specified verification goals rather than relying on hand-written test suites.
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